Press Release - June 29, 2006 - Coordinate Metrology Systems Conference (CMSC) 2006 Showcases Measurement/Inspection Experts Delivering Nineteen Technical White Papers
P R E S S R E L E A S E CMSC Press Contact: Belinda Jones, HiTech Marketing , 860-399-1147, belinda.jones@hitechmarketing.com CMSC Marketing Contact: Rina Molari-Korgel, 817-683-2261, pastchairman@cmsc.org Link to press release: http://www.cmsc.org/CMSCPressRelease.htm Coordinate Metrology Systems Conference (CMSC) 2006 Showcases Measurement/Inspection Experts Delivering Nineteen Technical White Papers CMSC held from July 17-21, 2006 at the Doubletree Hotel at the entrance to Universal Studios, Orlando, Florida Redmond, WA - June 29, 2006 - The CMSC Society announced today the organization has chosen nineteen Industry White Papers to be presented at its annual Coordinate Metrology Systems Conference (CMSC) 2006 from July 17-21, 2006 at the Doubletree Hotel located at the entrance to Universal Studios, Orlando, Florida. Metrology experts and scientists from prominent laboratories and leading manufacturers will deliver white papers covering 3D industrial measurement applications/topics catering to the specific interests of manufacturers, engineers, scientists, quality control specialists, metrologists, educators, and students. CMSC 2006 also features an Exhibition Hall of companies serving the technology needs of the industrial measurement marketplace. CMSC members are users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals. To register for the co nference, or for more information on the confer ence program, please visit the CMSC web site at http://www.cmsc.org. The following selections will be presented at the 2006 CMSC Conference: "Large-Scale Metrology Instrument Performance Evaluations at NIST", Authors: W.T. Estler, D.S. Sawyer, B. Borchardt, S. D. Phillips from Precision Engineering Division of NIST "Underwater Photogrammetric Verification of Nuclear Fuel Assemblies via Natural Feature Measurement", Authors: Dr. Kenneth Edmundson, Giuseppe Ganci, Chan-Hong Park, from companies: Geodetic Systems, Inc., Gancell Pty. Ltd., VisionTech, Inc "Active Alignment System for the LSST", Authors: William J. Gressler, Scott Sandwith from companies: National Optical Astronomy Observatory, New River Kinematics "Application of Unified Spatial Metrology Network to Estimate and Evaluate Spherical Measurement Systems", David Ober, Metris USA, Inc. "Let It Shine", Tom Clary, Metron Systems Inc. "Photogrammetric Antenna Surveys at Sub-freezing Temperatures on Black Island, Antarctica" Authors: David Sevsko, Thad Aryes, Russell Morrison from companies: General Dynamics C4 Systems, Geodetic Systems, Inc. "Modern High Precision High Speed Measurement of Segments and Moulds", Authors: Nod Clarke-Hackston, Manfred Messing, Dieter Loh, Rainer Lott from VMT GmbH "ASTM International Committee E57 on 3D Imaging Systems", Pat A. Picariello, ASTM International "Win-Win Solution for Metrology Interoperability", Troy Niehaus, Metronor Group "Multiple Reflection Techniques Used to Measure & Model a British Cannon Recovered from the Battle of Yorktown", Authors: Richard A. Uhal, Steven D. Hand, Colleen Brady Cunniffe from companies: Maglev, Inc., The Mariners' Museum "High Precision Photogrammetry Using RGB Colour", Prof. Dr. Thomas Luhmann, Institute for Applied Photogrammetry and Geoinformatics, University of Applied Sciences Oldenburg, Germany "Estimating the Performance of IRGPS (InfraRed Global Positioning System)", James Cobb, The Boeing Company "Measuring Thruster Location and Direction for NASA's STEREO Solar Science Mission", John Troll, Johns Hopkins University "A Paradigm Shift for Inspection", Alberto Griffa, Geomagic "Close-Range Photogrammetry: Beyond Industrial Metrology", Authors: H.B. Hanley, C.S. Fraser from Department of Geomatics, University of Melbourne, Australia "Optically Jointed Probing Systems for Large Volume Coordinate Metrology", Stephen Kyle, University College, London, Coventry University "Photogrammetry Measurement into Nuclear Areas from As-built 3D Modeling to Real-time Assistance for Modifications", Arnauld Dumont, ESIC-SN "Basic to Advanced CMM Skills for Southern California Manufacturers", Ray Elledge, Cerritos College CACT Division "High-Speed Non-contact Measurement Solutions", Antonio Mendes Nazare, ActiCM Who Should Attend the CMSC? Each year, CMSC attracts technology users, service providers, and OEM manufacturers of close-tolerance, portable industrial coordinate measurement systems, software, and peripherals. CMSC members and visitors travel from all corners of the globe to participate and enjoy the conference alongside their industry peers. Conference attendees hail from prominent science/research laboratories, and diverse industries such as aerospace, space hardware, antenna, automotive, shipbuilding, power generation, reverse engineering, and general engineering. About the CMSC Society CMSC is a society of users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals. The metrology systems utilized by industry and represented at the CMSC conference include traditional CMMs and PCMMs such as theodolites, laser projection systems, laser trackers, laser radars, photogrammetry/videogrammetry systems, scanners, and articulating arms. The CMSC society gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data. For more information on CMSC and how to join the organization, visit their web site at http://www.cmsc.org. About the Coordinate Metrology Systems Conference The Coordinate Metrology Systems Conference is an annual event sponsored by the CMSC Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe. CMSC is renowned for its comprehensive program of top-shelf white papers and applications presentations given by industry experts from science/research laboratories and manufacturing industries such as aerospace, space hardware, antenna, automotive, shipbuilding, power generation, and general engineering. No other trade show rivals the high level of authoritative information provided by CMSC members and master users of metrology instruments, software, and peripheral equipment for quality control, quality production, and precision assembly. -- 30 -- CMSC Press Contact: Belinda Jones HiTech Marketing llc Tel 860-399-1147 Fax 860-399-1148 belinda.jones@hitechmarketing.com www.hitechmarketing.com