Teradyne's FLEX Test System Awarded Test & Measurement World's 2003 Best in Test; SOC Test Per Pin Architecture Necessary for Emerging Devices

    BOSTON--Jan. 28, 2003--Teradyne, Inc. announced that Test & Measurement World magazine has selected Teradyne's Integra FLEX test system to receive a 2003 Best in Test Award. The Best in Test Awards honor new products that bring significant technological advances to the test industry market. Teradyne will receive the Best in Test award this spring during the Apex Conference and Exhibition in Anaheim, CA.
    "With FLEX, Teradyne has introduced a platform that will cost effectively address DC-to-microwave analog circuits as well as DFT-enabled logic circuits. FLEX's reconfigurable universal-slot architecture appears to be well positioned to effectively deploy the clock and instrumentation resources necessary to test emerging mixed-signal system-on-chip devices," said Rick Nelson, Test & Measurement World executive editor.
    "Teradyne is honored Test & Measurement World has recognized technical advances on the FLEX that will be used for testing current and future generations of devices," said Ted Quinn, Teradyne's FLEX product manager. "Our primary goal is that manufacturers leverage these technical advances to achieve tester configuration freedom and engineering efficiency. Configuration freedom means fewer testers to meet consumer market dynamics. And, engineering efficiency means your engineers are focused on device production not tester limitations. The key to success in consumer electronics is fewer testers being more productive - FLEX does that."
    FLEX combines three key test technology innovations to increase productivity for IC makers: SOC Tester Per Pin architecture, universal slots, and multi-level IGXL 5.0 software. Lower test cost is achieved by testing more devices faster with the new SOC Tester Per Pin architecture. Unlike last generation serial systems that limit parallel efficiency, FLEX is a collection of fully parallel self-contained instruments. Each has its own clock, sequencer, dynamic setup memory and parametric capability; even the DC instruments are pattern driven, synchronized to the device. The universal slot tester-in-a-test-head allows any mix of digital, DC, analog, power, and microwave resources. When device volume needs change, FLEX is easily reconfigured to match the new test demands. Universal slots make FLEX more efficient, allowing higher site counts and quick change as needs shift. FLEX changes everything with multilevel IGXL 5.0 software: template programming, device specific test procedures, and low-level system control - all at once. To learn more about FLEX, the test system awarded Best in Test, visit www.teradyne.com/integraflex.

    About The Best in Test Awards

    The Best in Test Awards are presented annually by the editors of Test & Measurement World, a magazine for engineers and engineering managers responsible for buying equipment in the test, measurement, inspection and vision markets. The technical editors review all nominations as well as all products covered in the magazine in the past year. Products are selected for a Best in Test Award based on technical merit and technical innovation. The magazine invites subscribers of the magazine to vote for Test Product of the Year from the twelve products the editors have selected to receive a 2003 Best in Test Award. To learn more about the awards visit: http://www.tmworld.com/bit_2003.htm.

    About Teradyne

    Teradyne manufactures Automatic Test Equipment and interconnection systems that deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. Teradyne had sales of $1.22 billion in 2002 and employs about 7200 people worldwide. For more information visit www.teradyne.com.