Advantest, Cadence to Collaborate on Zero-Defect Testing Requirements for Automotive Electronics

Tokyo, Dec 6, 2006 (JCN) - Advantest and Cadence Design Systems announced a collaborative partnership on December 6 to deliver a methodology for zero-defect testing of digital automotive electronics. The collaboration is intended to enable faster time-to-market and more complete testing of complex digital devices for new automobiles.

Diverging sharply from their analog roots, automotive manufacturers today are driving their suppliers to advanced semiconductor technology in support of high-value automotive applications. They are also demanding just-in-time delivery and, to reduce their risk, zero defects. This combination of factors requires a faster, more accurate testing methodology to achieve the same high quality and low risk.

Using Advantest's automated test equipment (ATE) platforms, the collaboration combines traditional analog part average testing (PAT) techniques with the industry leading small delay defect detection capabilities of the Cadence Encounter True-Time Test software to produce a new generation of single-pass test methodologies for zero-defect testing of digital parts.

By Chris Lui, JCN Staff Writer